TetraMAX 2: DSM Testing
 

OVERVIEW

This workshop covers the Transition Fault Model in detail. You will learn:
  • The requirements and different fault models for At-Speed testing as well as the “Launch on Shift” and “Launch on System Clock” techniques to detect an at-speed fault.
  • The Standard Test Interface Language (STIL) Procedure File (SPF) is needed to guide the DRC and Pattern formatting. You will learn how to modify a given Stuck-At SPF file to suit an At-Speed fault model.
  • The timing exceptions in TetraMAX and how to use PrimeTime to automatically generate scripts that can be sourced in TetraMAX to take care of the False and Multi cycle Paths.
  • The advanced commands, design guidelines, and flow considerations for the Transition fault model. You will learn how to combine the Transition and Stuck-At patterns to reduce the overall pattern volume and how to take advantage of an automated flow to generate the script from TetraMAX, which can be directly sourced in PrimeTime to perform STA in test mode.

OBJECTIVES

At the end of this workshop the student should be able to:

  • Describe the need for At-Speed testing.
  • List the At-Speed fault models available.
  • Describe the launch techniques for at-speed faults.
  • Successfully edit a Stuck-At SPF file to suit Transition ATPG.
  • Define the timing exceptions
  • Automate the process of script generation for TetraMAX, using PrimeTime. This script will take care of the False and Multi Cycle paths.
  • Modify a given Stuck-At fault model script to run for Transition ATPG.
  • State the steps required to merge Transition and Stuck-At fault patterns to reduce the overall patterns.
  • Automatically create scripts that can be used in PrimeTime to perform test mode STA.
  • List the design guidelines, requirements, and flow considerations for the Transition fault model.

AUDIENCE PROFILE

ASIC, SoC or Test Engineers who perform ATPG at the Chip or SoC level.

PREREQUISITES

To benefit the most from the material presented in this workshop, you should:

A. Have taken the TetraMAX 1 workshop.

OR

B. Possess knowledge in the following areas:

  • Scan Architecture and ATPG
  • Stuck-At fault model ATPG with TetraMAX
  • SPF file

COURSE OUTLINE

Module 1

  • Introduction of At-Speed defects
  • Source of Test Escapes and chip failure
  • Requirements for At-Speed testing
  • Popular fault models for At-Speed testing

Module 2

  • Transition Fault model
  • Transition Fault detection method
  • Techniques to launch and capture a fault

Module 3

  • STIL file
  • Modifications to STIL file for At-Speed testing
  • Special Waveform Tables
  • New Capture Procedures

Module 4
  • Timing Exceptions
  • Automated way to generate timing exceptions form PrimeTime

Module 5

  • TetraMAX Scripts
  • Design Guidelines
  • Flow consideration and requirements
  • Pattern merging
  • Automated way to generate the scripts for PrimeTime to perform testmode STA.

SYNOPSYS TOOLS USED

TetraMAX 2007.03
PrimeTime 2006.12-SP2
VCS 2006.06